Second-hand UH4150 Spectrophotometer Dual Wavelength/UV-VIS Spectrophotometer for Transfer

Japan HitachiUH4150 SpectrophotometerDual Wavelength Receiver: CCD Wavelength Range: Vacuum UV Automation

The UH4150 employs a prism-grating (P-G) double monochromator optical system, inheriting the characteristics of the U-4100 optical system. Compared to the common grating-grating (G-G) system, the prism-grating (P-G) system shows no significant change in the intensity of S and P polarized light. Even for samples with low transmittance and reflectance, the UH4150 achieves low-noise measurement. The parallel beam enablesmeasurement of reflected and scattered light.

Sales Technology: Manager Yang 18103045976

The angle of incidence is crucial for measuring the specular reflectance of solid samples. For converging beams, the angle of incidence varies depending on factors such as the focal length of the lens, so the simulated design values of optical films like conductive multilayer films and prisms will differ from the actual measured values.

However, for parallel beams, the angle of incidence relative to the sample remains constant, enabling accurate measurement of specular reflectance. Additionally, parallel beams can be used for evaluating diffusivity (haze) and measuring lens transmittance.

A variety of detectors are available to suit different measurement purposes.

Integrating spheres of eight different materials, sizes, and shapes are available.